Title Details: | |
X-ray Fluorescence Spectroscopy |
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Authors: |
Koui, Maria Avdelidis, Nikolaos Theodorakeas, Panagiotis Cheilakou, Eleni |
Reviewer: |
Theofanidis, Theofilos |
Description: | |
Abstract: |
The sixth chapter presents the method of X-Ray Fluorescence Spectroscopy (XRF). It begins with a review of the fundamental principles of the method and provides an analysis of the X-ray fluorescence mechanism and the resulting X-ray spectra. This is followed by a description of typical configurations and instrumentation used in X-ray spectrometers. Finally, the experimental setup and data acquisition process of XRF spectroscopy are presented through a series of applications for the qualitative and quantitative elemental analysis of various materials — such as construction materials, metallic materials and alloys, minerals, ceramics, pigments, and more.
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Type: |
Chapter |
Creation Date: | 2015 |
Item Details: | |
License: |
http://creativecommons.org/licenses/by-nc-sa/3.0/gr |
Handle | http://hdl.handle.net/11419/6173 |
Bibliographic Reference: | Koui, M., Avdelidis, N., Theodorakeas, P., & Cheilakou, E. (2015). X-ray Fluorescence Spectroscopy [Chapter]. In Koui, M., Avdelidis, N., Theodorakeas, P., & Cheilakou, E. 2015. Non-Destructive and Spectroscopic Methods of Examination of Materials [Undergraduate textbook]. Kallipos, Open Academic Editions. https://hdl.handle.net/11419/6173 |
Language: |
Greek |
Is Part of: |
Non-Destructive and Spectroscopic Methods of Examination of Materials |
Publication Origin: |
Kallipos, Open Academic Editions |