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Title Details:
X-ray Fluorescence Spectroscopy
Authors: Koui, Maria
Avdelidis, Nikolaos
Theodorakeas, Panagiotis
Cheilakou, Eleni
Reviewer: Theofanidis, Theofilos
Description:
Abstract:
The sixth chapter presents the method of X-Ray Fluorescence Spectroscopy (XRF). It begins with a review of the fundamental principles of the method and provides an analysis of the X-ray fluorescence mechanism and the resulting X-ray spectra. This is followed by a description of typical configurations and instrumentation used in X-ray spectrometers. Finally, the experimental setup and data acquisition process of XRF spectroscopy are presented through a series of applications for the qualitative and quantitative elemental analysis of various materials — such as construction materials, metallic materials and alloys, minerals, ceramics, pigments, and more.
Type: Chapter
Creation Date: 2015
Item Details:
License: http://creativecommons.org/licenses/by-nc-sa/3.0/gr
Handle http://hdl.handle.net/11419/6173
Bibliographic Reference: Koui, M., Avdelidis, N., Theodorakeas, P., & Cheilakou, E. (2015). X-ray Fluorescence Spectroscopy [Chapter]. In Koui, M., Avdelidis, N., Theodorakeas, P., & Cheilakou, E. 2015. Non-Destructive and Spectroscopic Methods of Examination of Materials [Undergraduate textbook]. Kallipos, Open Academic Editions. https://hdl.handle.net/11419/6173
Language: Greek
Is Part of: Non-Destructive and Spectroscopic Methods of Examination of Materials
Publication Origin: Kallipos, Open Academic Editions